Probing electron induced defects in CaF2 by photothermal displacement

نویسندگان

  • M. Reichling
  • R. Bennewitz
  • E. Matthias
چکیده

The surface displacement technique is used to measure the temperature and frequency dependence of the periodic expansion of a CaF2-surface subject to a modulated focused beam of lkeV electrons. Theoretical models are presented for a prediction of the observed phenomena based on thermal transport and defect lifetime effects. The use of such investigations for the study of thermal and non-thermal transport phenomena in alkaline-earth halides is discussed.

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تاریخ انتشار 2017